30 lines
772 B
C
30 lines
772 B
C
/* ----------------------------------------------------------------------------
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* GTSAM Copyright 2010, Georgia Tech Research Corporation,
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* Atlanta, Georgia 30332-0415
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* All Rights Reserved
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* Authors: Frank Dellaert, et al. (see THANKS for the full author list)
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* See LICENSE for the license information
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* -------------------------------------------------------------------------- */
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///////////////////////////////////////////////////////////////////////////////
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//
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// TESTHARNESS.H
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//
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// The primary include file for the framework.
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//
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///////////////////////////////////////////////////////////////////////////////
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#ifndef TESTHARNESS_H
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#define TESTHARNESS_H
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#include "Test.h"
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#include "TestResult.h"
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#include "Failure.h"
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#include "TestRegistry.h"
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#endif
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